• B M Borgbjerg, F Gjerris, M J Albeck, J Hauerberg, and S V Børgesen.
• University Clinic of Neurosurgery, Rigshospitalet, Copenhagen, Denmark.
• Acta Neurochir (Wien). 1998 Jan 1;140(5):459-64; discussion 465.

AbstractResults of 884 first-time shunts inserted in the time period from 1958 to 1989 are retrospectively evaluated, 1) to perform a durability analysis of a shunt based on Kaplan-Meyer method, 2) to compare the rate of revision for ventriculo-atrial (VA) and ventriculo-peritoneal (VP) shunts, 3) to compare the durability of a VA shunt with a VP shunt and 4) to do a stratified durability analysis comparing the VA and VP shunts in relation to the following background variables: shunt type, time period and age of the patient. Furthermore the specific complications related to VA and VP shunts are identified based on findings in the literature. Overall one-year shunt durability is 57% and five-year shunt durability is 37%. The median shunt durability is 1.68 years. Revision rate is 51% for VA shunts and 38.5% for VP (p < 0.05). Shunt durability is longer for VP shunts though the difference is not significant (p < 0.1). By use of stratified analysis of shunt durability no differences however are found between the two shunting methods. Hence the apparent difference in revision rate between VA and VP shunts seems secondary to variations in follow-up time and variations in background variables. To supplement our statistical analysis we have performed a literature study to look at the specific complications associated with VA and VP shunts. It seems as if the specific complications in relation to the VA shunting method are more severe than in relation to the VP shunting method.

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